Photo Highlights: Advances in Antenna and EMC Measurement Techniques Workshop – June 30, 2025

On June 30, 2025, the IEEE EMC Society, in collaboration with the IEEE Antennas and Propagation Society Technical Committee on Antenna Measurement (TCAM), hosted a one-day in-person workshop and technical tour titled:

Advances in Antenna and EMC Measurement Techniques

Université Côte d'Azur | 08:30 CEST

This event brought together experts and industry leaders in the field of antenna and EMC measurements to share their latest insights and developments. The engaging lineup of speakers included:

Laurent Le Coq – Université de Rennes I, M²ARS Director
Benoit Derat – Rohde & Schwarz, Engineering Senior Director; IEEE EMC Society Distinguished Lecturer; TCAM Committee Member
Ramiro Serra – Eindhoven University of Technology, Associate Professor
Guillaume Andrieu – Xlim Laboratory, University of Limoges, Associate Professor; IEEE EMC Society French Chapter Chair
Garth D'Abreu – ETS-Lindgren, Automotive Solutions Director; IEEE EMC Society Senior Member
Juan Antonio Del Real – Maury Microwave, EMEA Sales Director
Walid EL HAJJ – Intel Corporation, Wireless Test and Certification Center Scientist Officer

Participants benefited from cutting-edge technical presentations and had the opportunity to tour local measurement facilities, fostering valuable networking and collaboration opportunities across academia and industry.

Event Photos Below

Original LinkedIn post: View on LinkedIn

More Info & Registration Link (Archived): https://lnkd.in/gFHq82Mn