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Call for Special Issue Papers

  1. Measurement Technologies for Emerging 5G and Beyond Channel Characterization and Antenna Systems

    Guest Co-Editors: Wei Fan, Tian Hong Loh, Lars Foged, Benoit Derat, Yi Huang, and Pekka Kyösti
    Submission Deadline: February 28th, 2024
    Final Decision: May 1st, 2024
    Publication Date: August 1st, 2024

Details of each Special Issue are given below.


Measurement Technologies for Emerging 5G and Beyond Channel Characterization and Antenna Systems

Download the Call for Papers

A raft of advanced wireless technologies is increasingly emerging in the arena of modern 5G and 5G beyond wireless communication systems design. This includes, among other technologies, the utilization of massive multiple-input multiple-output (MIMO) systems with analog, hybrid and digital structures covering frequency range (FR)1, FR2 and between, ultra-wide system bandwidth, reconfigurable intelligent surface (RIS) and millimeter-wave (mmWave) and sub-THz frequency technologies, and machine learning technologies etc. Radio metrology is essential to ensure that radio system design should meet target radio specifications and performance in practice. Even though there are already many pioneering works on theoretical and measurement-based works, radio metrology for beyond 5G antenna systems is still in the level of infancy, and many challenges are still present. More specifically:

  • It is important to evaluate MIMO capable radios under realistic fading channel conditions. Cable conducted testing has been the dominant testing method for sub-6 GHz communication systems, where antennas ports are mostly accessible for conducted testing. However, for massive MIMO antenna systems with hundreds of antenna elements, conducted testing obviously becomes infeasible. Moreover, it is likely that mmWave and sub-THz systems will not have standard antenna ports, rendering over-the-air (OTA) the only testing solution. However, the current testing methods and systems are costly, time-consuming, and cumbersome, making them unsuitable for future radio systems.
  • Antenna metrics and radiation characteristics are typically defined and measured in plane wave conditions. However, this requirement becomes very demanding in practice for future radios due to large antenna numbers and beam-steering capability of the antenna-under-testing (AUT) and non-ideal testing scenarios e.g. power-only measurements, near-field effects, hardware impairment, etc. Therefore, a fast, efficient and cost-effective antenna measurement method is critical.
  • There has been a high interest on sub-Terahertz (sub-THz) and THz channel measurements and characterization. Theoretical backgrounds and models for wave propagation and wave-material interaction at THz are lacking its knowledge and experimental evidence in many aspects.

The objective of this special issue is to address the challenges in radio metrology for emerging 5G and beyond antenna and wireless technologies. The topics of interest include, but not limited to:

  • Radio channel sounding and emulation related topics
    • Massive MIMO, sub-Terahertz (sub-THz) and THz channel measurements and characterization.
    • Developments of 5G/6G channel sounder, radio channel emulator, and other testbeds for performance testing
    • Evaluation of the performance of reconfigurable intelligent surfaces (RIS).
  • Antenna measurements related topics
    • Anechoic chamber and Reverberation chamber-based antenna testing methods
    • Massive MIMO, Millimeter-wave antenna array antenna array diagnosis, calibration, and characterization
    • Reconfigurable intelligent surface (RIS) related calibration and characterization
    • Recent progress on antenna ranges, e.g. plane wave generator, compact antenna testing range (CATR) and near-field chambers.
  • OTA related topics
    • “Wireless cable or cable-free” methods for UE and BS type DUTs
    • Virtual drive testing
    • Conformance evaluation of communication systems
    • Performance evaluation of communication systems in critical propagation scenarios
    • Progress in standardization of 5G and beyond 5G metrology

Guest Co-Editors:

Wei Fan
Aalborg University, Denmark
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Tian Hong Loh
National Physical Laboratory, UK
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Lars Foged
Microwave Vision Group, Italy
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Benoit Derat
Rohde & Schwarz, Germany
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Yi Huang
University of Liverpool, UK
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Pekka Kyösti
Keysight Technologies, Finland
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Deadlines

Paper Submission: February 28th, 2024
Final Decision: May 1st, 2024
Publication: August 1st, 2024